Controle estatístico de processo aplicado à produção de dispositivos eletrônicos

Abstract

Manufacturing electronic mobile communication products requires high quality control, achieved through measurements and tunings of each unit produced. The goal of this publication is the evaluation of statistical process control (SPC) to monitor the quality of products and the process capability index Cpk. In other words, this study compares the sensitivity of control charts to detect variations in process mean and standard deviation. In this sense, Shewhart control charts and cumulative sum (CUSUM) control charts were comparatively analyzed to select the best SPC in order to guarantee more accurate measurements and devices tuned with lower deviations. Shewhart, in this case, uses the mean and the standard deviation of samples measured during a defined period of time. CUSUM control charts, based on cumulative sums, are statistical tools successfully used to evaluate processes in different industries. The Shewhart control chart was optimized to monitor the capability index Cpk. According to results obtained under the conditions of this experience, CUSUM control chart has higher sensibility when the process has small shifts. It was not observed efficacy of optimized Shewhart control chart to monitor Cpk.