Utilização de testes metalográficos (cross-section, dye pry e raio x) para análise de causa raiz de defeito: estudo de caso em uma empresa de manufatura de placa de computador

Resumo

The Metallography allows us to observe the microstructure of metallic welds, it is through this observation that we can understand the macro structural performance of certain components and therefore plays a very important role in understanding the behavior of materials and in identifying anomalies that cause them not to work or shorten the useful life of products. This paper summarizes the ongoing researches about the improvement and the identification of defects through metallographic tests. The essential objective should be at a better understanding of the weld ability relationships, the different characteristics of the components and the defects generated, the proposal for this work would be: a) to identify, using the Cross section, Dye Pry and X-ray metallographic tests, the root cause of the weld ability problems found in the production process; b) Cross Section: check through a test made from a cut with cold embedding with Epoxy Resin of a mounted plate and with the use a x50 microscope to evaluate the microstructure of a chosen sample, in a chosen section, finding results such as layer thickness measurements, presence of voids, shorts, cracks; c) Dye Pry: understand, through testing with a penetrating liquid, to detect surface rupture defects, such as crevices and cracks, which are not detectable with the naked eye; d) X-rays: perform images capable of analyzing connections of BGA balls, interconnections of circuit boards, presence of voids, non-filling of barrels and ruptures in the tracks e) identify and quantify anomalies found in the microstructures of the solder structure to find the root cause of the defect through image analysis. As expected, results, the study aims to present the tests and metallographic analysis, using notebook electronic boards, however the data provided can be used for any type of product, the technical support for the interpretations of the various microstructures are based on international standards.

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TERRA, Nathália Mattos. Utilização de testes metalográficos (cross-section, dye pry e raio x) para análise de causa raiz de defeito: estudo de caso em uma empresa de manufatura de placa de computador. 2024. 120 f. Dissertação (Mestrado em Engenharia de Produção) - Universidade Federal do Amazonas, Manaus (AM), 2024.

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